Books.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.
Overview
* Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits.
* Provides guidance on the implementation of circuit protection measures.
* Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts.
* Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.
Synopsis
* Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits.
* Provides guidance on the implementation of circuit protection measures.
* Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts.
* Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.
Booknews
Addresses the problem of electrostatic discharge, which is becoming more critical as high-density circuit technologies shrink to sub-micro dimensions. Describes the methods of reproducing the phenomenon in a controlled test environment, the behavior of different semiconductor devices under electrostatic discharge conditions, and design and layout requirements for protection circuits. Case studies demonstrate approaches to solving design problems and analyzing failures. Annotation c. Book News, Inc., Portland, OR (booknews.com)