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Electronics - Semiconductors
Semiconductor Memories: Technology, Testing, and Reliability by Ashok K. Sharma β€” book cover

Semiconductor Memories: Technology, Testing, and Reliability

by Ashok K. Sharma, IEEE, MD Facp Sharma
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Overview

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.

Synopsis

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.

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Editorials

From the Publisher

"...a valuable reference..." (Microelectronics Reliability, Vol. 43, 2003)

Book Details

Published
September 1, 2002
Publisher
IEEE Computer Society Press
Pages
480
Format
Hardcover
ISBN
9780780310001

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