Medical, Pathology
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin, Joseph Goldstein, C.E. Fiori
Available on Bookshop
Write a review
Books.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.
Log in to track your reading progress.
Book Details
Published
July 1, 2008
Publisher
Springer-Verlag New York, LLC
Pages
466
Format
Hardcover
ISBN
9780306421402