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Overview
This book will introduce test and design engineers to new techniques that can be used to improve testing and quality of a wide range of circuits.This book explains what arithmetic built-in self-test (BIST) is, and how it can be used in a wide variety of circuits. It shows how BIST can support new design methodologies that rely on hardware/software co-design, DSP cores and embedded processors.Hardware/embedded system designers, test engineers, researchers working on IC/core testing, and graduate students.Editorials
Booknews
Describes the software-based, built-in, self-testing for systems with embedded processors that engineers are increasingly using as early as possible in the design process to prevent costly prototyping turns. Offers tutorials, schemes to generate tests employing adders and multipliers, an accumulator-based scheme for the parallel compaction of test responses, fault simulation techniques, and applications. Annotation c. by Book News, Inc., Portland, Or.Book Details
Published
October 27, 1997
Publisher
Prentice Hall
Pages
288
Format
Hardcover
ISBN
9780137564385