Science, Electron Microscopes & Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
Nigel D. Browning (Editor), Stephen Pennycook
Available on Bookshop
Write a review
Books.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.
Log in to track your reading progress.
Book Details
Published
July 1, 2000
Publisher
Cambridge University Press
Format
Hardcover
ISBN
9780521554909