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Electronics - Circuits - Integrated, Electronics - Circuits - VLSI
Design and Test Techniques for VLSI and WSI Circuits by R. E. Massara β€” book cover

Design and Test Techniques for VLSI and WSI Circuits

by R. E. Massara
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Overview

This book provides an up-to-date view of VLSI and WSI design and test methodologies, combining an introduction to the topics covered with an indication of current research directions and results. The coverage is thus suitable for undergraduates studying microelectronic systems design, for postgraduate researchers and for graduate engineers and managers seeking an overview or introduction to semi- and full-custom large-scale chip design.

The contributions have been carefully chosen to take the reader from an introductory treatment of the gate array design route, very typically favoured by new entrants into the business of custom chip design, through a study of more ambitious design tools that allow the user to progress naturally to full-custom design.

Having establihsed the style of design tools that are either in current use, or which are likely to set the future style of chip design packages, the book moves on to review the related fields of design-for-testability and fault tolerant VLSI design. The final section of the book deals with the concept of Wafer Scale Integration - WSI - which offers very exciting opportunities for devices of large system-scale complexities.

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Editorials

Booknews

The contributions take the reader from an introductory treatment of the gate array design route through a study of more ambitious design tools, and then review the related fields of design-for-testability and fault tolerant VLSI design. The final section deals with the concept of Water Scale Integration--WSI--which offers new opportunities for devices of large system-scale complexities. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Book Details

Published
December 1, 1989
Publisher
Institution of Engineering and Technology
Pages
315
Format
Hardcover
ISBN
9780863411656

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