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Microscopes & Microscopy - Electron Microscopes, Nuclear Physics - Particles & Elements, Electronics - Semiconductors
Evaluation of Advanced Semiconductor Materials by Electron Microscopy by D. Cherns — book cover

Evaluation of Advanced Semiconductor Materials by Electron Microscopy

by D. Cherns
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These proceedings comprise papers reviewing technical progress as well as applications in the areas of: electron microscopy; electron diffraction; energy loss microanalysis; cathodoluminescence; Schottky Barriers; interfaces; analysis of local strains; surface microscopy; and defects in heteroepitaxy. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Book Details

Published
January 1, 1990
Publisher
Springer
Pages
412
Format
Hardcover
ISBN
9780306433627

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