Exploring Scanning Probe Microscopy with MATHEMATICA

This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies.
The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy.
The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.

This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with atomic force microscopy, scanning tunneling microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory.

The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The MATHEMATICA code for

all the text, figures and tables is included on the CD-ROM, affording the freedom to change the parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.

Changing the parameters and running the code will have the effect of automatically replacing the relevant figures and tables presented in the book.

Booknews

With an image of buckyballs gracing its cover, this reference/ advanced-level text<-->with an accompanying Internet site<--> presents the computational models that underlie the physical phenomena, theories, and experiments associated with scanning tunneling microscopy, atomic force microscopy, and related cutting-edge techniques. Sarid (Optical Sciences Center, University of Arizona, Tucson) presents analysis with exercises on: cantilevers, tip- sample adhesion and force curve, free vibrations, noncontact and tapping mode, tunneling (of the metal-insulator and Fowler-Nordheim types), scanning tunneling spectroscopy, Coulomb blockade, density of states, electrostatics, and near-field optics. Annotation c. by Book News, Inc., Portland, Or.

Dror Sarid is Professor and Director of the Optical Data Storage Center at the Optical Sciences Center, the University of Arizona in Tucson. His interests have been in the fields of light scattering phenomena and guided wave physics, and in the past 20 years he has been studying Scanning Tunneling Microscopy, Atomic Force Microscopy and related fields. Dr. Sarid is the author of Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces (OUP) and Exploring Scanning Probe Microscopy with Mathematica (Wiley) as well as of more than 150 publications and seven patents.