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Overview
Achieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them.
This quick reference on semiconductor reliability addresses the key question: How will the understanding of failure mechanisms affect the future?
Chapters discuss:
- failure sites, operational loads, and failure mechanism
- intrinsic device sensitivities
- electromigration
- hot carrier aging
- time dependent dielectric breakdown
- mechanical stress induced migration
- alpha particle sensitivity
- electrostatic discharge (ESD) and electrical overstress
- latch-up
- qualification
- screening
- guidelines for designing reliability
Guidebook for Managing Silicon Chip Reliability focuses on device failure and causes throughout - providing a thorough framework on how to model the mechanism, test for defects, and avoid and manage damage. It will serve as an exceptional resource for electrical engineers as well as mechanical engineers working in the field of electronic packaging.
"...discusses the principal failure mechanisms associated with integrated circuits & the practices typically used for addressing these failures outlining statistics, new practices & interactions between design & process features."