The study of interfaces is one of the oldest areas of research in materials science. The presence of grain boundaries in materials has long been recognized, as has its crucial role in determining mechanical properties. Another long-recognized concept is that the properties of a surface are quite different from those of the bulk. Researchers have been able to study these interfaces, both internal and external, with a detail not before possible. These advances have stemmed from the ability to obtain atomic resolution images of interfaces, to measure accurate chemical compositions of interfaces, and to model these interfaces and their properties. This book goes a step further to explore how all of this information can be used. Significant attention is given to the crystallographic nature of grain boundaries and interfaces, and the relationship between this nature and the performance of a material. The EBSP in solving a number of interface-related problems is also featured. Topics include: introductory concepts and modelling; characterization - orientation and interfacial films; characterization - microscopy and chemistry; mechanical properties; general interfaces; composites, laminates and coatings and thin films.
Proceedings of the December 1996 symposium. Contributors of 74 papers sought to go beyond structural and chemical studies to explore how this information could be used to engineer interfaces for improved properties and overall improved material performance. Themes include the crystallographic nature of grain boundaries and interfaces and its relationship to the performance of the material; the realization that materials can be processed so that the number of boundaries with good properties can be optimized; and the versatility of EBSP (electron back-scattering diffraction pattern) analysis in solving a number of interface-related problems. Annotation c. by Book News, Inc., Portland, Or.
