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Material Characterization Using Ion Beams by J. P. Thomas and A. Cachard — book cover
Quantum Physics, Microscopes & Microscopy - Electron Microscopes, Materials Science - General & Miscellaneous, Ions & Ionization in Chemistry, Solid State Physics - General & Miscellaneous, Electronics - Solid State

Material Characterization Using Ion Beams

by J. P. Thomas and A. Cachard
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Book Details

Published
June 7, 1978
Publisher
London ; Plenum Press, c1978.
Pages
536
Format
Hardcover
ISBN
9780306357282

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