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Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem by Egerton, R. β€” book cover

Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem

by Egerton, R.
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Overview

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

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Book Details

Published
October 29, 2010
Publisher
Springer-Verlag New York, LLC
Pages
214
Format
Paperback
ISBN
9781441938374

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