Physics, Fabrication, and Applications of Multilayered Structures

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These proceedings deal with low-dimensional, artificially layered materials, and review the characterization techniques using x-rays, electrons, neutrons, ion-backscattering, and electron microscopy, in varied multilayered media such as metal-semiconductors, metal- insulators, and semiconductor-insulators. Applications to microelectronics, x-rays, and neutron mirrors conclude the presentations. Poster-session summaries are appended. Annotation c. Book News, Inc., Portland, OR (booknews.com)