Join Books.org — it's free

Physics of Light - Spectrum Analysis, Analytical Chemistry - Spectrometry & Spectroscopy
Quantitative X-Ray Spectrometry, Vol. 20 by Ron Jenkins β€” book cover

Quantitative X-Ray Spectrometry, Vol. 20

by Ron Jenkins, Jenkins Jenkins
Available on Bookshop Write a review

Books.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.

Log in to track your reading progress.

Overview

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.

Synopsis

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.

Journal of Applied Crystallography

...a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis.

Reviews

There are no reviews yet. Log in to write one.

Editorials

Analytical Chemistry

International praise for the previous edition... "...critically describes x-ray instrumentation and techniques...has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book.

Journal of Applied Crystallography

...a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis.

Journal of Analytical Atomic Spectrometry

Ron Jenkins could...be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF.... "...the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer....an important contribution to XRF and will be of interest to both new and established workers in this field.

Booknews

A substantially revised reference covering virtually every important aspect of x-ray spectrometry from basic principles to the selection of instrument parameters and sample preparation. Chapters cover the interaction of x-rays with matter; sources for the excitation of characteristic x-rays; instrumentation; statistics; general computer applications and quantitative spectrum analysis as applied to energy-dispersive analysis; specimen preparation; qualitative analysis; basic problems in quantitative analysis; methods and models for quantitative analysis; trace analysis; radiation health hazards in x-ray spectrometry; and applications of x-ray spectrometry. Numerous appendices clarify nomenclature and provide relevant lists and tables. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Book Details

Published
April 1, 1995
Publisher
Taylor & Francis, Inc.
Pages
504
Format
Hardcover
ISBN
9780824795542

More by Ron Jenkins

Similar books