Physics of Light, Technology - General & Miscellaneous, Chemistry - General and miscellaneous, Applied Science, Science - Applied, Analytical Chemistry, Physics, Technology - General & Miscellaneous
Scanning Electron Microscopy, X-Ray Microanalysis and Analytical Electron Microscopy
C. E. Lyman, Charles E. Lyman, John Armstrong, Patrick Echlin, Charles Fiori
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Overview
Extensively revised, the second edition of this highly acclaimed text provides students with a comprehensive introductioon to the field of scanning electron microscopy (SEM) and X-ray microanalysis. All chapters have been updated, and a completely new chapter has been added to provide an introduction to quantitative X-ray microanalysis of bulk samples.The authors, emphasizing the practical aspects of the techniques described, discuss user-controlled functions of scanning electron microscope and electron microphobe electron optics, the characteristics of electro - specimen interactions, image formation and interpretation, and X-ray spectrometry. Sample preparation for physical and biological specimens and a data base of useful parameters for SEM and X-ray microanalysis calculations round out the text.Book Details
Published
August 31, 1990
Publisher
Springer
Pages
407
Format
Hardcover
ISBN
9780306435911