Books.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.
Overview
In this volume of the Six Sigma and Beyond series, quality engineering expert D.H. Stamatis focuses on how Statistical Process Control (SPC) relates to Six Sigma. He emphasizes the "why we do" and "how to do" SPC in many different environments. The book provides readers with an overview of SPC in easy-to-follow, easy-to-understand terms. The author reviews and explains traditional SPC tools and how they relate to Six Sigma and goes on to cover the use of advanced techniques. In addition, he addresses issues that concern service SPC and short run processes, explores the issue of capability for both the short run and the long run, and discusses topics in measurement.
In this volume of the Six Sigma and Beyond series, quality engineering expert D. H. Stamatis focuses on how Statistical Process Control (SPC) relates to Six Sigma. He emphasizes the "why we do" and "how to do" SPC in many different environments. The book provides readers with an overview of SPC in easy-to-follow, easy-to- understand terms. The author reviews and explains traditional SPC tools, how they relate to Six Sigma and goes on to cover the use of advanced techniques. In addition, he addresses issues that concern service SPC and short run processes, and explores the issue of capability for both the short run and the long run, as well as topics in measurement.
Synopsis
In this volume of the Six Sigma and Beyond series, quality engineering expert D.H. Stamatis focuses on how Statistical Process Control (SPC) relates to Six Sigma. He emphasizes the "why we do" and "how to do" SPC in many different environments. The book provides readers with an overview of SPC in easy-to-follow, easy-to-understand terms. The author reviews and explains traditional SPC tools and how they relate to Six Sigma and goes on to cover the use of advanced techniques. In addition, he addresses issues that concern service SPC and short run processes, explores the issue of capability for both the short run and the long run, and discusses topics in measurement.