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Overview
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation, originally published as Volume 18, Issues 4 and 5 of the Journal of Electronic Testing, is a valuable reference for researchers and students interested in various aspects of SOC testing.Synopsis
Various aspects of system-on-a-chip (SOC) integrated circuit testing are addressed in 13 papers on test planning, access, and scheduling; test data compression; and interconnect, crosstalk, and signal integrity. Topics include concurrent test of core-based SOC design and testing for interconnect crosstalk defects using on-chip embedded processor cores. The editor is affiliated with Duke University. The book is reprinted from a Special Issue of the Journal of Electronic Testing, vol. 18, nos. 4 & 5. There is no subject index. Annotation (c)2003 Book News, Inc., Portland, OR