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Testing and Evaluation of Infrared Imaging Systems by Gerald C. Holst — book cover

Testing and Evaluation of Infrared Imaging Systems

by Gerald C. Holst
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Overview

In its first update in 10 years, this text describes the characterization of all modern infrared imaging systems.

In this new edition:

• The concept of target/background delta-T with its dependence on background temperature is clarified.
• Description of the three-dimensional noise model has been expanded with test methods plainly addressed.
• Major updates were made to delineate Scanning and staring array methodologies in MTF measurement, and advantages and disadvantages of each are discussed.
• Although MRT test procedures have not changed very much over the years, observer variability is now well-documented.
• All figures and graphs have been redrawn.

Synopsis

In its first update in 10 years, this text describes the characterization of all modern infrared imaging systems.

In this new edition:

• The concept of target/background delta-T with its dependence on background temperature is clarified.
• Description of the three-dimensional noise model has been expanded with test methods plainly addressed.
• Major updates were made to delineate Scanning and staring array methodologies in MTF measurement, and advantages and disadvantages of each are discussed.
• Although MRT test procedures have not changed very much over the years, observer variability is now well-documented.
• All figures and graphs have been redrawn.

Booknews

New edition of a handbook on the use of infrared imaging systems, updating the 1993 edition. Topics include general measuring techniques, system responsivity, modulation and phase transfer functions, geometric transfer function, automated testing, and uncertainty analysis. Each chapter includes a table listing representative specifications. Annotation c. by Book News, Inc., Portland, Or.

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Booknews

New edition of a handbook on the use of infrared imaging systems, updating the 1993 edition. Topics include general measuring techniques, system responsivity, modulation and phase transfer functions, geometric transfer function, automated testing, and uncertainty analysis. Each chapter includes a table listing representative specifications. Annotation c. by Book News, Inc., Portland, Or.

Book Details

Published
July 1, 1998
Publisher
SPIE Press
Pages
417
Format
Hardcover
ISBN
9780819429414

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