Tolerance Analysis of Electron Circuits Using MathCAD
Robert BoydBooks.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.
Overview
Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATHCADä offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including:
- worst-case analysis,
- limits for production testing,
- component stress analysis,
- determining if a design meets specification limits, and
- manufacturing yield analysis Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.
"...offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process...using a practical approach...allowing the user to put the techniques directly into practice."
Synopsis
Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATHCADä offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including:
Booknews
Written for the electronics professional, this compact reference describes step-by-step methods used to perform analyses essential to the design process of circuit cards and systems, including worst-case analysis, limits for production testing, component stress analysis, determining if a design meets specification limits, and manufacturing analysis. Using a practical approach that allows for direct application, Boyd (former technical instructor in the U.S. Air Force) discusses extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits. Annotation c. Book News, Inc., Portland, OR (booknews.com)