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Vlsi Fault Modeling And Testing Techniques by George W. Zobrist — book cover

Vlsi Fault Modeling And Testing Techniques

by George W. Zobrist
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Editorials

Booknews

Inaugurates a new Ablex series covering the state-of-the-art in various aspects of VLSI testing, fault modeling, environments, routing and placement, and logic design. Among the topics addressed in the present text are physical fault modeling and simulation for VLSI MOS circuits; designing CMOS gates to test open faults; testing bridging faults in VLSI; and testable design synthesis methods. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Book Details

Published
January 1, 1993
Publisher
ABC-Clio, LLC
Pages
208
Format
Hardcover
ISBN
9780893917814

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