Electronics - Circuits - VLSI
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Overview
Designed to introduce all aspects of the theory and practice of microelectronic testing to students, this text contains sufficient material on more advanced concepts to appeal to postgraduates involved in design and test research.Editorials
Booknews
Hurst, an editor at the , analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation c. by Book News, Inc., Portland, Or.Book Details
Published
October 15, 1997
Publisher
Institution of Engineering and Technology
Pages
560
Format
Hardcover
ISBN
9780852969014