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Nanotechnology, Physical & Theoretical Chemistry, Solid State Physics - Thin Films, Electronics - Microelectronics, Crystallography, Solid State Physics - General & Miscellaneous
X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research, Vol. 148 by Metin Tolan, M. Tolan β€” book cover

X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research, Vol. 148

by Metin Tolan, M. Tolan
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Overview

The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.

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Book Details

Published
November 1, 1998
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Pages
206
Format
Hardcover
ISBN
9783540651826

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