Overview
An Introduction to Surface Analysis by XPS and AES is a clear and accessible introduction to the key electron spectroscopic techniques used in surface analysis. Starting with an introduction to the basic concepts of electron spectroscopy, the text moves on to explain underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering and complementary methods have been included to provide an up-to-date account of these widely used techniques.Synopsis
A supplemental textbook for a graduate or undergraduate course introducing X-ray photoelectronic and Auger electron spectroscopy, and their application to analyzing the surfaces of solids. It does not deal with operating the spectrometers themselves, but should allow students to hold their own in dialogues with providers of XPS or AES service at a corporate research laboratory or service organization. Annotation ©2003 Book News, Inc., Portland, OR
Booknews
Considering the two most popular surface analysis techniques--X-ray photoelectron spectroscopy and Auger electron spectroscopy--this book covers the underlying physical principles, the instrumentation employed, the interpretation of the resulting spectra, applications in materials science, and comparison with other surface analytic techniques. Annotation c. Book News, Inc., Portland, OR (booknews.com)