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Nanoscale Spectroscopy and Its Applications to Semiconductor Research by Michael Carlberg — book cover

Nanoscale Spectroscopy and Its Applications to Semiconductor Research

by Michael Carlberg, Y. Watanabe, S. Heun
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Overview

Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.

Synopsis

Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.

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Book Details

Published
September 1, 2002
Publisher
Springer-Verlag New York, LLC
Pages
323
Format
Hardcover
ISBN
9783540433125

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