Microscopes & Microscopy - Electron Microscopes, Physics - General & Miscellaneous, Microscopes & Microscopy - General & Miscellaneous, Optics - General & Miscellaneous, Crystallography

$Atlas of Backscattering Kikuchi Diffraction Patterns by D. J. Dingley — book cover$

Atlas of Backscattering Kikuchi Diffraction Patterns

Name: Atlas of Backscattering Kikuchi Diffraction Patterns
Author: D. J. Dingley
ISBN: 9780750302128

by D. J. Dingley

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Overview

Cantor and Goringe: Electron Microscopy in Materials Science Series. Comprehensive reference on how to obtain EBDPs using a Scanning Electron Microscope (SEM) for identifying crystalline phases in: metals; semiconductors; ceramics; minerals. Sets out in logical order how to obtain and interpret these patterns. Extensively illustrated with examples of each of the most technologically important classes of material. Unique, no competitive volumes identified by authors, reviewers or research on Ulrich. Market: Research, library level, for metallurgists, materials scientists, physicists, physical chemists, geologists, mineralogists, crystallographers using diffraction techniques in scanning or tunnelling microscopy - predominantly in academic laboratories. Life: minimum five years. High value, beautifully reproduced photographs. Electron Backscattering Diffraction Patterns (EBDPs) are used by materials scientists to obtain an understanding of the fundamental properties of particular materials. An EBDP provides information about the crystallography and orientation of the crystal lattice of the specimen under examination. The pattern (or crystal map) is formed when electrons are backscattered from the crystal, which is irradiated with an electron beam. The intersection of relatively intense bands of electron mark the planes of symmetry within a particular crystal.

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Monochrome photographs obtained from 46 metals, minerals, ceramics, semiconductors, and six of the seven crystal systems with different Bravais lattices and point group symmetries, provide a comprehensive handbook to identifying crystalline phases. Diagrams on the facing pages highlight salient features. Also reviews the history, theory, techniques, and interpretation of backscattering Kikuchi diffraction. Addressed to practicing electron microscopists in materials science. Complements another volume in the series on using Kikuchi diffraction techniques in both scanning and transmission electron microscopes to measure grain boundary geometry. No index or bibliography. Annotation c. Book News, Inc., Portland, OR (booknews.com)