Scanning Electron Microscopy and X-ray Microanalysis
Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick EchlinBooks.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.
Overview
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Synopsis
The basis of this textbook is a short course taught by the authors at the Lehigh Microscopy Summer School. Chapters cover electron beam-specimen interaction, image formation and interpretation, x-ray spectral measurement, x-ray analysis, specimen preparation, and procedures for elimination of charging in specimens. The CD-ROM contains more advanced discussion that is detailed and equation-rich, much of which formed the last chapter of the second edition. Annotation (c)2003 Book News, Inc., Portland, OR