Join Books.org — it's free

Microscopes & Microscopy - Electron Microscopes, Physics of Light - Spectrum Analysis, Analytical Chemistry - Spectrometry & Spectroscopy
X-Ray Spectrometry In Electron Beam Instruments by Joseph Goldstein — book cover

X-Ray Spectrometry In Electron Beam Instruments

by Joseph Goldstein (Editor), David B. Williams
Available on Bookshop Write a review

Books.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.

Log in to track your reading progress.

Overview

This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.

Problems & trends in X-ray detector design for microanalysis/germanium X-ray detectors.

Synopsis

This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.

Booknews

A collection of papers derived from a special symposium held at the Microbeam Analysis Society Meeting of 1993 in Los Angeles, providing an overall view of current research in the field of x-ray spectrometry as it relates to the practice of electron probe x-ray microanalysis. Among the topics are the development of energy dispersive electron probe analysis; problems and trends in x-ray detector design for microanalysis; germanium x-ray detectors; modeling the energy dispersive x-ray detector; improving EDS performance with digital pulse processing; a review of wavelength dispersive spectrometry; and an evaluation of quantitative electron probe methods. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Reviews

There are no reviews yet. Log in to write one.

Editorials

Booknews

A collection of papers derived from a special symposium held at the Microbeam Analysis Society Meeting of 1993 in Los Angeles, providing an overall view of current research in the field of x-ray spectrometry as it relates to the practice of electron probe x-ray microanalysis. Among the topics are the development of energy dispersive electron probe analysis; problems and trends in x-ray detector design for microanalysis; germanium x-ray detectors; modeling the energy dispersive x-ray detector; improving EDS performance with digital pulse processing; a review of wavelength dispersive spectrometry; and an evaluation of quantitative electron probe methods. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Book Details

Published
May 1, 1997
Publisher
Springer-Verlag New York, LLC
Pages
396
Format
Hardcover
ISBN
9780306448584

More by Joseph Goldstein

Similar books