Microscopes & Microscopy - Electron Microscopes, Analytical Chemistry - Spectrometry & Spectroscopy
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Overview
These proceedings focus on the physical basis and underlying theory of electron optics and analysis. The theme of the conference was advances in images and analysis with electrons and other focussed probes. Topics covered included conventional electron optics and analysis, secondary ion mass spectroscopy, scanning Auger spectroscopy, x-ray microscopy, acoustic microscopy and lithography.
Book Details
Published
January 1, 1988
Publisher
Institute of Physics Publishing
Pages
253
Format
Hardcover
ISBN
9780854981816