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Earth Science, Applied Science, Science - Applied, Electrical & Electronic Engineering, Physics, Earth Science, Physics, Electrical & Electronic Engineering
Defect Analysis in Electron Microscopy by Michael Henry Loretto, R. E. Smallman — book cover

Defect Analysis in Electron Microscopy

by Michael Henry Loretto, R. E. Smallman
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Book Details

Published
February 1, 1976
Publisher
Chapman and Hall
Pages
134
Format
Hardcover
ISBN
9780412137709

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