Books.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.
Overview
Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.Synopsis
Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.
Booknews
A guide to testing integrated circuits for defects arising from the manufacturing process. After a thorough discussion of fault models and the complexity of the testing problem, describes the testing of combinational and sequential circuits, and current testing, a topic rarely covered elsewhere. Based on the proposition that the most effective and economical approach is to construct a fault model for each circuit, then test for the particular defects that are most likely. Annotation c. Book News, Inc., Portland, OR (booknews.com)