Electronics - Circuits - VLSI
Available on Bookshop
Write a review
Books.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.
Log in to track your reading progress.
Overview
This book discusses in detail the correlation between physical defects and logic faults, and shows you how Iddq testing locates these defects. The book provides planning guidelines and optimization methods and is illustrated with numerous examples ranging from simple circuits to extensive case studies.
Editorials
Booknews
Discusses issues in complementary metal-oxide semiconductor testing, such as logic testing, fault models, and physical defects. Includes Iddq test examples covering internal bridging, shorts between two metal lines, and gate-oxide defects, with corresponding logic tests to cover various defect conditions. Examines the feasibility of Iddq testing in the integrated circuit production environment in factories, and explains instrumentation issues such as off-chip and on-chip current sensing methods. Annotation c. Book News, Inc., Portland, OR (booknews.com)Book Details
Published
September 2, 1994
Publisher
Artech House
Pages
193
Format
Hardcover
ISBN
9780890067260