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Overview
This exhaustive new handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyroocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield.
Synopsis
This exhaustive new handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyroocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield.
Booknews
Contributors (all but one work for IBM) describe methods of defect reduction--the vital process of reducing cost and improving reliability--developed in the microelectronics world, but applicable to any manufacturing process of similar complexity. Discussion encompasses measurement systems, manufacturing control techniques, testing, diagnostics, failure analysis, and modeling--all in the interests of preventing, reducing, or quickly determining defects. Several sections are devoted exclusively to solving non-semiconductor manufacturing problems. Annotation c. Book News, Inc., Portland, OR (booknews.com)