Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis

The first hands-on guide to XRD and XRF sampling and specimen preparation

Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.

This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips.

With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort.

Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials
* Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more
* Features special chapters on specimen preparation equipment and XRF standards
* Contains useful bibliography and helpful references.

The first hands-on guide to XRD and XRF sampling and specimen preparation

Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.

This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips.

With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort.

Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials

* Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more

* Features special chapters on specimen preparation equipment and XRF standards

* Contains useful bibliography and helpful references.

Booknews

Provides detailed practical information on using X-ray fluorescence (XRF) spectrometry and X-ray diffraction (XRD) methods, focusing on how to avoid large systematic errors caused by improper selection and preparation of samples. Chapters are organized around major tasks likely to occur in an X-ray analysis, and contain step-by-step instructions for each specimen preparation procedure described, along with necessary theoretical information, equipment suggestions, and troubleshooting tips. Covers techniques for analyzing biological, geological, metallic, ceramic, and other materials, and addresses all aspects of specimen preparations, including handling unusual or very small samples, liquids, and solutions. Includes a glossary. For beginning and advanced X-ray analysts. Assumes background in theory. Annotation c. by Book News, Inc., Portland, Or.

VICTOR E. BUHRKE heads The Buhrke Company in Redwood City, California.

RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania.

DEANE K. SMITH is a professor emeritus in the Department of Geosciences at Pennsylvania State University.