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Microscopes & Microscopy - Electron Microscopes, Technology - General & Miscellaneous, Microscopes & Microscopy - General & Miscellaneous
Reflection Electron Microscopy and Spectroscopy for Surface Analysis by Zhong Lin Wang β€” book cover

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

by Zhong Lin Wang, Wang Zhong Lin
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Overview

In this book, RHEED, REM and REELS techniques are comprehensively reviewed for the first time. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. The book is written for materials scientists and graduate students and is entirely self-contained. FORTRAN source codes are provided for calculating crystal structure data and electron energy-loss spectra in different scattering geometries.

Synopsis

Self-contained book on electron microscopy and spectrometry techniques for surface studies.

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Book Details

Published
July 1, 2005
Publisher
Cambridge University Press
Pages
460
Format
Paperback
ISBN
9780521017954

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