Electronics - Circuits - VLSI
System-on-Chip Test Architectures: Nanometer Design for Testability
Laung-Terng Wang, Charles E. Stroud, Nur Touba, Nur A. Touba
Available on Bookshop
Write a review
Books.org participates in affiliate programs including Bookshop.org and the Amazon Services LLC Associates Program. We may earn a commission from qualifying purchases made through links on this page, at no additional cost to you.
Log in to track your reading progress.
No ratings yet.
Log in to write a review.
There are no reviews yet.