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Electronics - Circuits - Integrated, Microwave Technology, Engineering - Mathematics & Design
Yield And Reliability In Microwave Circuit And System Design by Michael D. Meehan β€” book cover

Yield And Reliability In Microwave Circuit And System Design

by Michael D. Meehan, John Purviance
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Editorials

Booknews

Advocates the proactive use of Monte Carlo methods in the computer-aided design of microwave circuits and systems. A discussion and presentation of ideas and arguments, rather than an encyclopedia of solutions. Addressed to design engineers just beginning to use statistical design and analysis, and to engineering managers who want to evaluate the benefits of applying them in a particular context. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Book Details

Published
December 1, 1993
Publisher
Artech House, Incorporated
Pages
300
Format
Hardcover
ISBN
9780890065273

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