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Fracture Mechanics, Electronic Packaging, Electronics - Microelectronics
Thermal Stress and Strain in Microelectronics Packaging by John H. Lau β€” book cover

Thermal Stress and Strain in Microelectronics Packaging

by John H. Lau
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Covers the foundation and practical applications of thermal stress management, relating relates theory to device-specific solutions for each package element and providing decision criteria for materials selections and geometry optimization. Includes guidelines on how to find thermal stresses and strains by thermomechanical methods, and how to change the materials and geometry of interconnect systems to achieve improvements in cost, performance, quality, size, and weight. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Book Details

Published
June 15, 1993
Publisher
Wiley, John & Sons, Incorporated
Pages
883
Format
Hardcover
ISBN
9780442010584

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